一种新的指纹技术能够从最具挑战性的金属表面（包括刀和枪械）获取高分辨率的指纹图像，这吸引办案人员解决过去悬案的兴趣。

Nottingham大学和Derby大学合作，利用高灵敏，且无破坏性地进行飞行时间二次离子质谱分析（ToF-SIMS），从而从传统手段无法提取的物体表面获取高分辨率的指纹图像。研究表面，对有问题的金属表面进行飞行时间二次离子质谱分析，获取的指纹细节图，能够定义脊线，并且汗孔的位置和形状清晰可见。

Nottinghan大学的James Sharp博士主导此次研究，他表面，提供可靠的清晰指纹，能为过去那些缺乏关键证据的案例提升可能性。ToF-SIMS成像是一种非常具有潜力且价值的手段，能够将不锈钢刀刃和枪械上的指纹可视化呈现。

A new fingerprint technique capable of producing high-resolution images from the most challenging of metal surfaces, including knives and firearms, is already attracting interest from detectives working on cold cases.

Experts at the University of Nottingham in collaboration with the University of Derby, are using highly sensitive, non-destructive Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS) to develop high resolution fingerprint images from surfaces conventional fingerprint imaging fails to pick up at all. The research—Exposing latent fingermarks on problematic metal surfaces using time of flight secondary ion mass spectroscopy—has shown the technique is capable of revealing fingerprints in so much detail, defined ridge definition and the position and shape of the sweat pores are clearly visible.

Dr James Sharp, from the School of Physics and Astronomy at the University of Nottingham led the research. He said: “This raises the possibility of being able to reliably visualise fingerprints on surfaces previously thought to be devoid of such crucial evidence. ToF-SIMS imaging has the potential and could be a valuable tool in helping to visualise fingermarks on objects such as stainless-steel knife blades and firearms.” 

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